Ellipsometers are high precision instruments capable of measuring the thickness of thin films with nominal accuracy well below 1 nm.

Our instrument is the Multiskop, by Optrel GmbH; it operates in extinction mode at the wavelength of 633 nm.

Operational modes include:

• Null-ellipsometry (also on Langmuir monolayers at the air/water interface, in liquid cell and/or variable temperature)
• Ellipsometric Imaging
• Brewster Angle Microscopy
• Total Internal Reflection Ellipsometry
• Surface Plasmon Resonance (SPR) for which we devoloped ad hoc software freely available in the Mathworks file exchange repository