- AFM in contact mode.Large area scanner 100X100X7.5 micron and high-resolution scanner 5X 5X1.5 micron are available for micro- and nano-scale measurements.
- Lateral force measurement and force-distance measurements
- A Peltier Cell is available for temperate control in the range 5-40°C
Access to Atomic Force Microscopes available at Centro Interdipartimentale Misure, for non-contact and intermittent contact measurements.