Using an ellipsometer, the thickness of thin films can be measured with exceptional precision, below 1 nm.

Thi instrument is a Multiskop, by Optrel GmbH; it works in extinction mode at single wavelength (632.8 nm).

Operational modes include:

• Null-ellipsometry (also on Langmuir monolayers at the air/water interface, in liquid cell and/or variable temperature)
• Ellipsometric Imaging
• Brewster Angle Microscopy
• Total Internal Reflection Ellipsometry
• Surface Plasmon Resonance (SPR)